A recent manuscript by Raines et al. has recently caught my attention. The authors present a method called "ankylography" that allows reconstructing the 3D density of a scattering object from a single wide-angle X-ray far-field diffraction pattern. Although I haven't done research work exactly on this topic, it touches many aspects of my field of expertise.

After reading the paper, I found that some aspects of the paper were problematic, so I decided to write a comment about it.

Shortly after, John Miao (professor at UCLA) gave a reply rejecting all my criticisms.

I replied with an open letter, to which John Miao responded with another arXiv manuscript.

Here is our latest email exchange, with a contribution from John Spence. I don't expect to have the time to pursue this discussion further. I hope that the documents above give enough information for readers to make their own minds.